On October 29, 2020, Phaos Technology Research Team had successfully patented their invention, the method and system for super resolution imaging.
The method includes moving a microsphere relative to an objective lens of a microscope to bring the microsphere into a first field of view when a first feature of a sample is observable and a second feature o the sample is not observable through the objective lens. The first feature and the second feature are concurrently disposed under visible light or white light illumination within the first field of view, of which is the first field of view is provided by a lens system in a first lens configuration. The first lens configuration includes the objective lens but does not include the microsphere. The microsphere is coupled to the microscope and configured for controllable movement in ambient air without contacting the sample.
Optical Imaging utilizing a conventional optical microscope has been widely used in many fields, including examination of biological samples and optical characterization of integrated circuits for failure analyses. However, achievable image resolution under visible light or white light illumination, with the aid of conventional microscopes, is limited by the diffraction limit. Particularly, the conventional optical microscope can only resolve objects with the proximity around half of the incident wavelength and may not be suitable for use in the optical characterization of nano-scale features, such as live viruses. Other non-optical techniques, such as scanning electron microscope (SEM) and transmission electron microscope (TEM) may be used to perform the nano-scale observation. However, these techniques require complex sample preparation and working conditions and may also be destructive to the samples.
Recently, super resolution imaging techniques, including Optical Microsphere Nanoscope (OMN) was realized to observe nano-scale features. However, this technique also has its limitation. For example, it requires the deposition of microsphere directly onto the surface of the sample. Furthermore, the field of view is restricted to the location of the microsphere.
In view of the foregoing, there is a need to provide a super resolution nano-imaging system and method to visualize nano-scale features without being invasive to the samples. It is also desirable to provide a highly flexible, easy to use and economical scheme for super resolution nano-imaging.
The method involves moving a microsphere relative to an objective lens of a microscope to bring the microsphere into a first field of view when a first featue of a sample is observable and a second feature of the sample is not observable through the objective lens/ The first and second feautre will concurrently disposed under visible light illumination within the first field of view, wherein the first field of view is provided by a lens system in a first lens configuration.
The first lens configuration includes objective lens, without the micropshere. The micropshere being coupled to the microscope and configured for controllable movement in ambient air without contacting the sample.
The method may further include moving the microsphere to bring the second feature into focus in the second image portion without changing the objective lens.
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