The patented Optical Microsphere Nanoscopy (OMN) technology is able to resolve target features down to 137nm scale in visible light and ambient air observation, breaking the ~200nm Abbe’s resolution Limit and bridging a major gap between optical and electron microscopy.

Our own software team created the system that supports the microscope. Each feature is well-thought-out, with the goal of providing users with the utmost convenience and ease. Our team is constantly adding new features and improving the user interface to make your job easier!